Tag: Nondestructive Evaluation (NDE)

Development of Chipless RFID Sensors for Nondestructive Evaluation (NDE) Applications Speaker: Katelyn (Katie) Brinker, Ph.D. Candidate, Electrical Engineering, Iowa State University Date: Thursday, June 2, 2022 Time: 10:00 am Abstract Critical materials and structures are constantly subjected to fatigue and degradation, and monitoring and maintaining civil, space, and aerospace infrastructure is an ongoing critical issue.…